Polarization instrumentation


Polarimeter Systems with High Dynamic Range

  • Three Wavelength Ranges Available
    • 400 nm – 700 nm
    • 600 nm – 1080 nm
    • 900 nm – 1700 nm
  • Rotating-Wave-Plate-Based Measurement
  • High Dynamic Range of 70 dB
  • Excellent Azimuth and Ellipticity Accuracy of ±0.25°
  • Sampling Rate up to 400 Samples/s
  • Beam Terminates Inside the Module
  • Ø3.0 mm Free-Space Beam Input or FC/PC Fiber Input
  • Fully Featured Software Includes Alignment Tool and Extinction Ratio Measurement Tool
Item # PAX1000VIS(/M) PAX1000IR1(/M) PAX1000IR2(/M)
Optical Parametersa
Wavelength Range 400 nm – 700 nm 600 nm – 1080 nm 900 nm – 1700 nm
Dynamic Range -60 dBm to +10 dBm
(10-6 mW to 10 mW)
Sampling Rate Defaultb 30 Samples/s
Maximumc 400 Samples/s
Measurable SOPd Entire Poincaré Sphere
Azimuth Accuracye ±0.25°
Ellipticity Accuracy ±0.25°
DOPf Accuracy ±1.0%
Free Space Aperture Ø3 mm
Input Fiber Connector FC/PC Accepted by Included Ø12 mm Collimatorg
Included Ø12 mm Collimatorg F240FC-A F240FC-B F240FC-C
Maximum Input Beam Divergence
Warm-Up Time for Rated Accuracy 15 min
Additional Specifications
Command and Control Interface USB 2.0 Mini-B
Input Power Supply Via USB 2.0 Mini-B Interface or
DS15 External Power Supplyh
DS15 Power Supply Ratings 15.0 V; 1.2 A
Operating Temperature Range 5 °C to 40 °C
Storage Temperature Range -40 °C to 70 °C
Dimensions 51.0 mm x 55.0 mm x 56.3 mm
(2.01″ x 2.17″ 2.22″)
Bottom Mounting Features One 1/4″-20 (M6) and Two 8-32 (M4) Threaded Holes
Weight 0.28         g (0.62 lbs)

Birefringence Imaging System

  • Built-In 633 nm Light Source
  • Measures Sample Retardance up to a Half-Wave (316 nm) and Azimuths up to ±90°
  • Ø20 mm Field of View
  • Complete Imaging System Includes Software and Laptop
  • Compatible with MLS203-1 XY Scanning Stage
  • Custom Operating Wavelengths by Contacting Tech Support
Specifications
Light Source Wavelengtha 633 nm
Retardance Measurement Range Standard Retardance Range: 0 to 316 nm
Low Retardance Range: 0 to 100 nm
Azimuth Measurement Range ±90°
Retardance Measurement Accuracy Standard Retardance Range: <±10 nm
Low Retardance Range: <±1 nm
Azimuth Measurement Accuracy Standard Retardance Range: <±3°
Low Retardance Range: <±1°
Measurement Rateb <15 s
Field of View Ø20 mm
Spatial Resolution 9.77 μm
Interfaces USB 2.0 and Gigabit Ethernet
Camera Resolution 2048 x 2048 Pixels
Dimensions 500.0 mm (D) x 360.0 mm (W) x 672.0 mm (H)
Weight 26 kg (57.3 lbs)
Operating Temperature 0 to 40 °C
Storage Temperature -15 to 65 °C
Included Accessories Laptop PC, Sample Holders, Birefringent Resolution Target (Item # R2L2S1B)

Soleil-Babinet Compensators

  • Uniform Retardance Over Full Aperture
  • Continuously Variable Retardance from 0 to 2π
  • Graduated Rotation Ring and Digital Micrometer Aid Repeatability
  • 45° Detent Index Stops
  • Options for 365 – 800 nm or 740 – 1650 nm
Item # SBC-VIS SBC-IR
Wavelength Range 365 – 800 nm 740 – 1650 nm
Retardance Adjustment 0 to 2π (Full Wave)
Clear Aperture Ø10 mm
Beam Deviation <1 arcmin
Transmitted Wavefront Error <λ/4
Surface Quality 40-20 Scratch-Dig
Digital Readout Resolution 0.001 mm
Repeatability Valuesa @ 405 nm: 0.0016 waves
@ 633 nm: 0.001 waves
@ 800 nm: 0.0008 waves
@ 1064 nm: 0.0012 waves
@ 1550 nm: 0.0008 waves
Rotation 360°, Continuous
Rotation Division Scale 1° Increments
Detent Index Stops Every 45°
Mounting Holes #8 (M4) Counterbore (6 Places)

Liquid Crystal Polarization Rotators

  • Rotate Linear Input Polarization Continuously Through >180°
  • Extinction Ratio: >1000:1
  • AR Coatings on Air-to-Glass Interfaces
  • 532 nm or 633 nm Operating Wavelength from Stock
  • Other Wavelengths Available by Contacting Tech Support
Item # LCR1-532                                       LCR1-633
Operating Wavelength 532 nm                                           633 nm
Clear Aperture                                                         10 mm
Thickness                                                         9.4 mm
AR
Coating
Input Side Ravg < 0.5% from 350 to 700 nm
Output Side R < 0.25% at
532 nm (V-Coat)
                                                  R < 0.25% at
633 nm (V-Coat)
Extinction Ratioa,b >1000:1
TWEc λ/4 at 635 nm
Surface Quality 40-20 Scratch Dig
Angle of Incidence <1.5°
Rotation Angle -90° to +90° (>180° of Rotation)
Damage Threshold 1.0 J/cm2 (532 nm, 10 Hz, 8 ns, Ø200 µm)
0.01 J/cm2 (532 nm, 100 Hz, 76 fs, Ø162 µm